MaxMile Technologies introduces EpiEL mapping system optimized for nitride-based LED applications
MaxMile EpiEL system is a virtual LED device fabrication & characterization system which can be used to measure LED device parameters directly on epiwafers. Without any costly and time-consuming device fabrication, yet as through a finished device, EpiEL reveals not only the electro-luminescence (EL) but also the electrical properties of epitaxial material. The newly released EpiEL-700 is optimized for rapid electroluminescence (EL) evaluation for LED epiwafers with optically transparent substrates, such as nitride-based LED on sapphire substrate. It has additional capability for simulating different light extraction approaches. EpiEL-700 can also be used to investigate the optical non-uniformity of material structures which leads to different emission intensity on both sides of epiwafers.
MaxMile also recently released an economic EpiEL solution (EpiEL-QT) for rapid electroluminescence (EL) evaluation on LED epiwafers. EpiEL-QT can be used to obtain EL spectra, LIV, output characteristics, and wavelength & FWHM shift curves directly on LED epiwafers. By probing the various points across the wafer, EpiEL-QT can quickly determine the quality of the material within minutes.
Electroluminescence characterization is usually only carried out after full device fabrication. Through temporally forming a LED device in the material, MaxMile EpiEL mapping systems have the capability to rapidly and nondestructively characterize the electrical and optical properties of unprocessed epiwafers without any costly and time-consuming device fabrication. MaxMile EpiEL mapping systems can be used to:
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Provide fast response for LED material development
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Enable "fabless" LED material and CVD system development
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Enable device-level quality control at early stage
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Facilitate LED/LD research and development (R&D) with a powerful tool
MaxMile Technologies, LLC is a developer and manufacturer of semiconductor test & measurement equipment, emphasizing on nondestructive testing or evaluation (NDT or NDE).
